Ian Jermyn

CR1, INRIA Sophia Antipolis

Keywords: Shape, geometry, statistics, Bayesian, field, random, Markov, phase, long range, higher-order, contour, Riemannian, metric, segmentation, optimization, graph

Mail: iandotjermynatinriadotfr
Phone: (33)4-92-38-50-79
Fax: (33)4-92-38-76-43
Postal address: INRIA Sophia Antipolis , 2004, route des Lucioles, 06902 Sophia Antipolis Cedex, France


My research could be summed up in the phrase ‘statistical geometry’. Most of my work concerns the statistical modeling of shape and geometric structure, using various different methodologies and techniques (contours, phase fields, Markov random fields, long-range and higher-order interactions, shape spaces and Riemannian geometry,…), and associated problems, such as estimation algorithms. I also work on the application of information geometry to Bayesian inference. This work is motivated by, and has been extensively applied to, problems in image processing and computer vision, and in particular satellite and aerial remote sensing imagery.

Short Bio:

Ian Jermyn has a PhD in Theoretical Physics from the University of Manchester and another in Computer Vision from the Courant Institute at New York University. After spells as a researcher at the International Centre for Theoretical Physics in Trieste, funded by the Royal Society and the European Union Marie Curie programme, he joined the Ariana project-team at Inria Sophia Antipolis Méditerranée in 2000, from 2001 as a Senior Research Scientist. In 2010, he moved to Durham University as Reader in Statistics in the Department of Mathematical Sciences. In 2013, he rejoined Inria as a member of the Ayin team.

Last publications:

Publications HAL de Ian,Jermyn du labo/EPI ayin

Elastic Matching of Parameterized Surfaces Using Square-Root Normal Fields, I. H. Jermyn, S. Kurtek, E. Klassen and A. Srivastava. European Conference on Computer Vision (ECCV) Florence, Italy, November 2012.

Shape Analysis of Elastic Curves in Euclidean Spaces, A. Srivastava, E. Klassen, S. Joshi, I. H. Jermyn. IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 33, no. 7, pp. 1415–1428, 2011.